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Proceedings Paper

Sensitivity analysis of an assembled Fourier transform microspectrometer
Author(s): Jeongsik Sin; Woo Ho Lee; Harry E. Stephanou
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Paper Abstract

This paper presents the statistical formulation of misalignments of optical components. As a case study, sensitivity analysis is performed to evaluate the optical performance of an assembled Fourier Transform (FT) microspectrometer. Precision alignment of optical components is a critical factor to achieve high sensitive measurement. Positional and angular misalignments of optical components are propagated and accumulated from one part to another as the beam is delivered. Optical paths are modeled as kinematic variables of a linked chain, and its propagation is calculated using forward kinematics with homogeneous transform matrices. This approach not only formulates the deviation of beam paths as traditional optics do, but also accommodates statistical variables to represent the mean and variance of kinematic errors. With the assumption of Gaussian distribution of the errors, the statistical equation was linearly propagated. The beam deviation was further combined with a light coupling model at the detector to evaluate the degradation of optical. Its prototype and experimental results were also reported.

Paper Details

Date Published: 28 April 2010
PDF: 9 pages
Proc. SPIE 7680, Next-Generation Spectroscopic Technologies III, 76800T (28 April 2010); doi: 10.1117/12.850800
Show Author Affiliations
Jeongsik Sin, The Univ. of Texas at Arlington (United States)
Woo Ho Lee, The Univ. of Texas at Arlington (United States)
Harry E. Stephanou, The Univ. of Texas at Arlington (United States)


Published in SPIE Proceedings Vol. 7680:
Next-Generation Spectroscopic Technologies III
Mark A. Druy; Christopher D. Brown; Richard A. Crocombe, Editor(s)

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