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Proceedings Paper

Wavelet based image quality self measurements
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Paper Abstract

Noise in general is considered to be degradation in image quality. Moreover image quality is measured based on the appearance of the image edges and their clarity. Most of the applications performance is affected by image quality and level of different types of degradation. In general measuring image quality and identifying the type of noise or degradation is considered to be a key factor in raising the applications performance, this task can be very challenging. Wavelet transform now a days, is widely used in different applications. These applications are mostly benefiting from the wavelet localisation in the frequency domain. The coefficients of the high frequency sub-bands in wavelet domain are represented by Laplace histogram. In this paper we are proposing to use the Laplace distribution histogram to measure the image quality and also to identify the type of degradation affecting the given image. Image quality and the level of degradation are mostly measured using a reference image with reasonable quality. The discussed Laplace distribution histogram provides a self testing measurement for the quality of the image. This measurement is based on constructing the theoretical Laplace distribution histogram of the high frequency wavelet sub-band. This construction is based on the actual standard deviation, then to be compared with the actual Laplace distribution histogram. The comparison is performed using histogram intersection method. All the experiments are performed using the extended Yale database.

Paper Details

Date Published: 28 April 2010
PDF: 12 pages
Proc. SPIE 7708, Mobile Multimedia/Image Processing, Security, and Applications 2010, 77080J (28 April 2010); doi: 10.1117/12.850299
Show Author Affiliations
Naseer Al-Jawad, Univ. of Buckingham (United Kingdom)
Sabah Jassim, Univ. of Buckingham (United Kingdom)


Published in SPIE Proceedings Vol. 7708:
Mobile Multimedia/Image Processing, Security, and Applications 2010
Sos S. Agaian; Sabah A. Jassim, Editor(s)

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