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Proceedings Paper

Fast and precise point spread function measurements of IR optics at extreme temperatures based on reversed imaging conditions
Author(s): Volker Melzer; Hans-Georg Heckmann; Christian Ritter; Joachim Barenz; Michael Raab
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Paper Abstract

Point Spread Function (PSF), Modulation Transfer Function (MTF) and Ensquared Energy (EE) are important performance indicators of optical systems for surveillance, imaging and target tracking applications. We report on the development of a new measurement method which facilitates fast real time measurement of the two dimensional PSF and related performance parameters of a MWIR optical module under room temperature as well as under extreme temperature conditions. Our new measurement setup uses the law of reversibility of optical paths to capture a highly resolved, magnified image of the PSF. By using of an easy add-on thermally insulating enclosure the optical module can be exposed to and measured under both variable high and low temperatures (-50°C up to 90°C) without any external impact on the measurement. Also line of sight and various off-axis measurements are possible. Common PSF and MTF measurement methods need much more correction algorithms, whilst our method requires mainly a pinhole diameter correction only and allows fast measurements of optical parameters under temperature as well as fast and easy adjustment. Additionally comparison of the captured, highly resolved PSF with optical design data enables purposeful theoretical investigation of occurring optical artifacts.

Paper Details

Date Published: 22 April 2010
PDF: 18 pages
Proc. SPIE 7662, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI, 766213 (22 April 2010); doi: 10.1117/12.850194
Show Author Affiliations
Volker Melzer, LINOS Photonics GmbH & Co. KG (Germany)
Hans-Georg Heckmann, LINOS Photonics GmbH & Co. KG (Germany)
Christian Ritter, LINOS Photonics GmbH & Co. KG (Germany)
Joachim Barenz, Diehl BGT Defence GmbH & Co. KG (Germany)
Michael Raab, Diehl BGT Defence GmbH & Co. KG (Germany)

Published in SPIE Proceedings Vol. 7662:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI
Gerald C. Holst; Keith A. Krapels, Editor(s)

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