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Proceedings Paper

Type-II superlattices: the Fraunhofer perspective
Author(s): Robert Rehm; Martin Walther; Johannes Schmitz; Frank Rutz; Andreas Wörl; Ralf Scheibner; Johann Ziegler
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Paper Abstract

In the past years, the development of the type-II InAs/GaSb superlattice technology at the Fraunhofer-Institute for Applied Solid State Physics (IAF) has been focused on achieving series-production readiness for third generation dualcolor superlattice detector arrays for the mid-wavelength infrared spectral range. The technology is ideally suited for airborne missile threat warning systems, due to its ability of low false alarm remote imaging of hot carbon dioxide signatures on a millisecond time scale. In a multi-wafer molecular beam epitaxy based process eleven 288×384 dualcolor detector arrays are fabricated on 3" GaSb substrates. Very homogeneous detector arrays with an excellent noise equivalent temperature difference have been realized. The current article presents the type-II superlattice dual-color technology developed at IAF and delivers insights into a range of test methodologies employed at various stages during the fabrication process, which ensure that the basic requirements for achieving high detector performance are met.

Paper Details

Date Published: 3 May 2010
PDF: 12 pages
Proc. SPIE 7660, Infrared Technology and Applications XXXVI, 76601G (3 May 2010); doi: 10.1117/12.850172
Show Author Affiliations
Robert Rehm, Fraunhofer-Institut für Angewandte Festkörperphysik (Germany)
Martin Walther, Fraunhofer-Institut für Angewandte Festkörperphysik (Germany)
Johannes Schmitz, Fraunhofer-Institut für Angewandte Festkörperphysik (Germany)
Frank Rutz, Fraunhofer-Institut für Angewandte Festkörperphysik (Germany)
Andreas Wörl, Fraunhofer-Institut für Angewandte Festkörperphysik (Germany)
Ralf Scheibner, AIM INFRAROT-MODULE GmbH (Germany)
Johann Ziegler, AIM INFRAROT-MODULE GmbH (Germany)

Published in SPIE Proceedings Vol. 7660:
Infrared Technology and Applications XXXVI
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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