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Proceedings Paper

Real-time near-infrared spectroscopic inspection system for adulterated sesame oil
Author(s): Sukwon Kang; Kang-jin Lee; Jaeryong Son; Moon S. Kim
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Paper Abstract

Sesame seed oil is popular and expensive in Korea and has been often mixed with other less expensive vegetable oils. The objective of this research is to develop an economical and rapid adulteration determination system for sesame seed oil mixed with other vegetable oils. A recently developed inspection system consists of a light source, a measuring unit, a spectrophotometer, fiber optics, and a data acquisition module. A near-infrared transmittance spectroscopic method was used to develop the prediction model using Partial Least Square (PLS). Sesame seed oil mixed with a range of concentrations of corn, or perilla, or soybean oil was measured in 8 mm diameter glass tubes. For the model development, a correlation coefficient value of 0.98 was observed for corn, perilla, and soybean oil mixtures with standard errors of correlation of 6.32%, 6.16%, and 5.67%, respectively. From the prediction model, the correlation coefficients of corn oil, perilla oil, and soybean oil were 0.98, 0.97 and 0.98, respectively. The Standard Error of Prediction (SEP) for corn oil, perilla oil, and soybean oil were 6.52%, 6.89% and 5.88%, respectively. The results indicated that this system can potentially be used as a rapid non-destructive adulteration analysis tool for sesame seed oil mixed with other vegetable oils.

Paper Details

Date Published: 20 April 2010
PDF: 7 pages
Proc. SPIE 7676, Sensing for Agriculture and Food Quality and Safety II, 76760V (20 April 2010); doi: 10.1117/12.850163
Show Author Affiliations
Sukwon Kang, Rural Development Administration (Korea, Republic of)
Kang-jin Lee, Rural Development Administration (Korea, Republic of)
Jaeryong Son, Rural Development Administration (Korea, Republic of)
Moon S. Kim, USDA Agricultural Research Service (United States)


Published in SPIE Proceedings Vol. 7676:
Sensing for Agriculture and Food Quality and Safety II
Moon S. Kim; Shu-I Tu; Kaunglin Chao, Editor(s)

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