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Proceedings Paper

Instrument calibration and lineshape modeling for ultraspectral imagery measurements of industrial smokestack emissions
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Paper Abstract

The Telops Hyper-Cam midwave (InSb 1.5-5.μm) imaging Fourier-transform spectrometer observed the plume from a coal-burning power plant smokestack. From a distance of 600 meters, the plume was captured on a 128×64 pixel sub-window of the focal-plane array with each pixel imaging a 19.5×19.5cm2 region. Asymmetric interferograms were collected with long side and short side maximal optical path differences of 2.4cm and 0.9cm, respectively. Interferograms were recorded for each scan direction. The plume was strongly emissive across 1800-3000cm-1, and raw spectra revealed emissions from CO2, CO, H2O, NO, SO2, and HCl. A complete description of the instrument calibration and lineshape modeling is presented, including a simple and computationally efficient method of averaging spectra from forward- and reverse-scan interferograms that avoids the need to model a complex instrument lineshape. A simple radiative transfer model is developed to interpret the spectrum between 2565 ≤ ~ν ≤ 3000cm-1. Examination of the HCl spectrum demonstrates exceptional agreement between the data and an ideal instrument lineshape. For a pixel immediately above the stack exit, the plume temperature is estimated to be 399.6±0.6K with an SO2 concentration of 376±10ppmv, and these values agree well with in situ measurements of 407.0±0.2K and 383±2ppmv, respectively.

Paper Details

Date Published: 12 May 2010
PDF: 13 pages
Proc. SPIE 7695, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVI, 769516 (12 May 2010); doi: 10.1117/12.850142
Show Author Affiliations
Kevin C. Gross, Air Force Institute of Technology (United States)
Pierre Tremblay, Telops, Inc. (United States)
Kenneth C. Bradley, Air Force Institute of Technology (United States)
Martin Chamberland, Telops, Inc. (Canada)
Vincent Farley, Telops, Inc. (Canada)
Glen P. Perram, Air Force Institute of Technology (United States)

Published in SPIE Proceedings Vol. 7695:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVI
Sylvia S. Shen; Paul E. Lewis, Editor(s)

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