Share Email Print
cover

Proceedings Paper

Reliability evaluation of CIF (chip-in-flex) and COF (chip-on-flex) packages
Author(s): Jae-Won Jang; Kyoung-Lim Suk; Kyung-Wook Paik; Soon-Bok Lee
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

CIF (chip-in-flex) and COF (chip-on-flex) packages have the advantages of fine pitch capability, and flexibility. Anisotropic conductive films (ACFs) are used for the interconnection between chip and substrate. Display, mobile device, and semiconductor industry require for smaller and more integrated packages. Both CIF and COF packages are an alternative for the demands. However, there are some reliability problems of interconnection between the chip and substrate because the packages are subjected to various loading conditions. These may degrade the functionality of the packages. Therefore, reliability assessment of both packages is necessary. In this study, experimental tests were performed to evaluate the reliability of interconnection between the chip and substrate of CIF and COF packages. Thermal cycling tests were performed to evaluate the resistance against thermal fatigue. The shape and warpage of the chip of CIF and COF packages were observed using optical methods (e.g., shadow Moiré and Twyman/Green interferometry). These optical Moiré techniques are widely used for measuring small deformations in microelectronic packages. The stress distribution around the chip was evaluated through FEA (finite element analysis). In addition, we suggested modifying design parameter of CIF packages for the reliability enhancement.

Paper Details

Date Published: 15 April 2010
PDF: 10 pages
Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 752266 (15 April 2010); doi: 10.1117/12.850049
Show Author Affiliations
Jae-Won Jang, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Kyoung-Lim Suk, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Kyung-Wook Paik, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Soon-Bok Lee, Korea Advanced Institute of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 7522:
Fourth International Conference on Experimental Mechanics

© SPIE. Terms of Use
Back to Top