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Proceedings Paper

Instrumentation for beam profiling in the terahertz regime
Author(s): Martin S. Heimbeck; Henry O. Everitt; Kent Taylor; Carys Davis; Eric Hamilton; David E. Thomas; Patrick J. Reardon; Jeffrey Hesler
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Paper Abstract

The standalone, portable Terahertz (THz) Imaging Profiler Array (TIPA) based on an Offner Relay design has been constructed as a THz beam profiler and multispectral imager. It integrates a solid-state detector technology (Schottky Diodes) that can be configured in an array to cover the frequency range from 0.60 to 0.90 THz. The reconfigurable 16 element Schottky diode detector array is utilized along with imaging and scanning mirror modules and system control hardware and software to produce high spatial or temporal beam profiles of THz beams. Images of THz source profiles are presented along with THz images of relevant targets. Potential applications are discussed.

Paper Details

Date Published: 26 April 2010
PDF: 12 pages
Proc. SPIE 7671, Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense, 76710J (26 April 2010); doi: 10.1117/12.849932
Show Author Affiliations
Martin S. Heimbeck, U.S. Army Aviation and Missile Research, Development and Engineering Ctr. (United States)
Henry O. Everitt, U.S. Army Aviation and Missile Research, Development and Engineering Ctr. (United States)
Kent Taylor, The AEgis Technologies Group, Inc. (United States)
Carys Davis, The AEgis Technologies Group, Inc. (United States)
Eric Hamilton, The AEgis Technologies Group, Inc. (United States)
David E. Thomas, The AEgis Technologies Group, Inc. (United States)
Patrick J. Reardon, The Univ. of Alabama in Huntsville (United States)
Jeffrey Hesler, Virginia Diodes, Inc. (United States)


Published in SPIE Proceedings Vol. 7671:
Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense
Mehdi Anwar; Nibir K. Dhar; Thomas W. Crowe, Editor(s)

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