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Proceedings Paper

Contrast evaluation of the polarimetric images of different targets in turbid medium: possible sources of systematic errors
Author(s): T. Novikova; A. Bénière; F. Goudail; A. De Martino
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Paper Abstract

Subsurface polarimetric (differential polarization, degree of polarization or Mueller matrix) imaging of various targets in turbid media shows image contrast enhancement compared with total intensity measurements. The image contrast depends on the target immersion depth and on both target and background medium optical properties, such as scattering coefficient, absorption coefficient and anisotropy. The differential polarization image contrast is usually not the same for circularly and linearly polarized light. With linearly and circularly polarized light we acquired the orthogonal state contrast (OSC) images of reflecting, scattering and absorbing targets. The targets were positioned at various depths within the container filled with polystyrene particle suspension in water. We also performed numerical Monte Carlo modelling of backscattering Mueller matrix images of the experimental set-up. Quite often the dimensions of container, its shape and optical properties of container walls are not reported for similar experiments and numerical simulations. However, we found, that depending on the photon transport mean free path in the scattering medium, the above mentioned parameters, as well as multiple target design could all be sources of significant systematic errors in the evaluation of polarimetric image contrast. Thus, proper design of experiment geometry is of prime importance in order to remove the sources of possible artefacts in the image contrast evaluation and to make a correct choice between linear and circular polarization of the light for better target detection.

Paper Details

Date Published: 26 April 2010
PDF: 9 pages
Proc. SPIE 7672, Polarization: Measurement, Analysis, and Remote Sensing IX, 76720Q (26 April 2010); doi: 10.1117/12.849907
Show Author Affiliations
T. Novikova, Ecole Polytechnique (France)
A. Bénière, Institut d'Optique Graduate School (France)
F. Goudail, Institut d'Optique Graduate School (France)
A. De Martino, Ecole Polytechnique (France)


Published in SPIE Proceedings Vol. 7672:
Polarization: Measurement, Analysis, and Remote Sensing IX
David B. Chenault; Dennis H. Goldstein, Editor(s)

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