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Proceedings Paper

Piezo impedance sensors to monitor degradation of biological structure
Author(s): Kiran Kishore Kumar Annamdas; Venu Gopal Madhav Annamdas
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Paper Abstract

In some countries it is common to have wooden structures in their homes, especially Japan. However, metals and its alloys are the most widely used engineering materials in construction of any military or civil structure. Re-visiting natural disasters like the recent Haiti earthquake (12 Jan 2010) or Katrina (cyclones) reminds the necessity to have better housing infrastructure with robust monitoring systems. Traditionally wood (green material) was accepted as excellent rehabilitation material, after any disaster. In recent times, the recycling materials extracted from inorganic, biodegradable wastes are converted into blocks or sheets, and are also used to assist public in rehabilitation camps. The key issue which decreases the life of these rehabilitated structure including green materials (like wood) is unnecessary degradation or deterioration over time due to insect or acid attack or rain/ice fall. The recycling material also needs monitoring to protect them against acid or rain/ice attacks. Thus, a few health monitoring techniques have emerged in the recent past. Electromechanical Impedance technique is one such technique, which is simple but robust to detect variations in the integrity of structures. In this paper, impedance based piezoceramic sensor was bonded on wooden sample, which was subjected to degradation in presence of acids. Variations in mass of plank are studied.

Paper Details

Date Published: 24 April 2010
PDF: 11 pages
Proc. SPIE 7673, Advanced Environmental, Chemical, and Biological Sensing Technologies VII, 76730S (24 April 2010); doi: 10.1117/12.849858
Show Author Affiliations
Kiran Kishore Kumar Annamdas, Univ. of Miami (United States)
Venu Gopal Madhav Annamdas, Jawaharlal Nehru Technological Univ. (India)

Published in SPIE Proceedings Vol. 7673:
Advanced Environmental, Chemical, and Biological Sensing Technologies VII
Tuan Vo-Dinh; Robert A. Lieberman; Günter Gauglitz, Editor(s)

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