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Proceedings Paper

Emission from dielectric materials at millimeter wavelengths in passive thermal environments
Author(s): James C. Weatherall
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Paper Abstract

The brightness of radiation escaping a two-dimensional slab of material under ambient illumination is characterized in terms of its complex dielectric constant. Transmission and reflection coefficients derive from wave optics and the application of Beer's law; the emissivity follows from detailed balancing using Kirchoff's law. The solutions are compared with intensities measured with a commercial millimeter wave imaging system. The results show that millimeter wave imaging of semi-transparent materials can be described by optical physics based on dielectric material properties. In addition, analysis of millimeter wave images of materials could provide information about their dielectric properties.

Paper Details

Date Published: 27 April 2010
PDF: 8 pages
Proc. SPIE 7670, Passive Millimeter-Wave Imaging Technology XIII, 76700F (27 April 2010); doi: 10.1117/12.849723
Show Author Affiliations
James C. Weatherall, SRA International, Inc. (United States)


Published in SPIE Proceedings Vol. 7670:
Passive Millimeter-Wave Imaging Technology XIII
David A. Wikner; Arttu R. Luukanen, Editor(s)

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