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Proceedings Paper

Radiation-induced failures and degradation of wireless real-time dosimeter under high-dose-rate irradiation
Author(s): K. Tsuchiya; K. Kuroki; N. Akiba; K. Kurosawa; T. Matsumoto; J. Nishiyama; H. Harano
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Paper Abstract

Radiation-induced malfunction and degradation of electronic modules in certain operating conditions are described in this report. The cumulative radiation effects on Atmel AVR microcontrollers, and 2.4 GHz and 303 MHz wireless network devices were evaluated under gamma ray irradiation with dose rates of 100, 10 and 3 Gy/h. The radiation-induced malfunctions occurred at doses of 510±22 Gy for AVR microcontrollers, and 484±111 and 429±14 Gy for 2.4 GHz and 303 MHz wireless network devices, respectively, under a 100 Gy/h equivalent dose rate. The degradation of microcontrollers occurred for total ionizing doses between 400 and 600 Gy under X-ray irradiation. In addition, we evaluated the reliability of neutron dosimeters using a standard neutron field. One of the neutron dosimeters gave a reading that was half of the standard field value.

Paper Details

Date Published: 5 May 2010
PDF: 11 pages
Proc. SPIE 7665, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XI, 76651G (5 May 2010); doi: 10.1117/12.849639
Show Author Affiliations
K. Tsuchiya, National Research Institute of Police Science (Japan)
K. Kuroki, National Research Institute of Police Science (Japan)
N. Akiba, National Research Institute of Police Science (Japan)
K. Kurosawa, National Research Institute of Police Science (Japan)
T. Matsumoto, National Institute of Advanced Industrial Science and Technology (Japan)
J. Nishiyama, National Institute of Advanced Industrial Science and Technology (Japan)
H. Harano, National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 7665:
Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XI
Augustus Way Fountain; Patrick J. Gardner, Editor(s)

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