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Proceedings Paper

In vitro near-infrared imaging of occlusal dental caries using a germanium-enhanced CMOS camera
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Paper Abstract

The high transparency of dental enamel in the near-infrared (NIR) at 1310-nm can be exploited for imaging dental caries without the use of ionizing radiation. The objective of this study was to determine whether the lesion contrast derived from NIR transillumination can be used to estimate lesion severity. Another aim was to compare the performance of a new Ge enhanced complementary metal-oxide-semiconductor (CMOS) based NIR imaging camera with the InGaAs focal plane array (FPA). Extracted human teeth (n=52) with natural occlusal caries were imaged with both cameras at 1310-nm and the image contrast between sound and carious regions was calculated. After NIR imaging, teeth were sectioned and examined using more established methods, namely polarized light microscopy (PLM) and transverse microradiography (TMR) to calculate lesion severity. Lesions were then classified into 4 categories according to the lesion severity. Lesion contrast increased significantly with lesion severity for both cameras (p<0.05). The Ge enhanced CMOS camera equipped with the larger array and smaller pixels yielded higher contrast values compared with the smaller InGaAs FPA (p<0.01). Results demonstrate that NIR lesion contrast can be used to estimate lesion severity.

Paper Details

Date Published: 5 March 2010
PDF: 7 pages
Proc. SPIE 7549, Lasers in Dentistry XVI, 75490K (5 March 2010); doi: 10.1117/12.849338
Show Author Affiliations
Chulsung Lee, Univ. of California, San Francisco (United States)
Cynthia L. Darling, Univ. of California, San Francisco (United States)
Daniel Fried, Univ. of California, San Francisco (United States)


Published in SPIE Proceedings Vol. 7549:
Lasers in Dentistry XVI
Peter Rechmann; Daniel Fried, Editor(s)

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