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Proceedings Paper

Machine learning algorithms to damage detection under operational and environmental variability
Author(s): Eloi Figueiredo; Gyuhae Park; Charles R. Farrar; Keith Worden; Joaquim Figueiras
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Paper Abstract

The goal of this paper is to detect structural damage in the presence of operational and environmental variations using vibration-based damage identification procedures. For this purpose, four machine learning algorithms are applied based on auto-associative neural networks, factor analysis, Mahalanobis distance, and singular value decomposition. A baseexcited three-story frame structure was tested in laboratory environment to obtain time series data from an array of sensors under several structural state conditions. Tests were performed with varying stiffness and mass conditions with the assumption that these sources of variability are representative of changing operational and environmental conditions. Damage was simulated through nonlinear effects introduced by a bumper mechanism that induces a repetitive, impacttype nonlinearity. This mechanism intends to simulate the cracks that open and close under dynamic loads or loose connections that rattle. The unique contribution of this study is a direct comparison of the four proposed machine learning algorithms that have been reported as reliable approaches to separate structural conditions with changes resulting from damage from changes caused by operational and environmental variations.

Paper Details

Date Published: 8 April 2010
PDF: 12 pages
Proc. SPIE 7650, Health Monitoring of Structural and Biological Systems 2010, 76502E (8 April 2010); doi: 10.1117/12.849189
Show Author Affiliations
Eloi Figueiredo, Univ. do Porto (Portugal)
Gyuhae Park, Los Alamos National Lab. (United States)
Charles R. Farrar, Los Alamos National Lab. (United States)
Keith Worden, The Univ. of Sheffield (United Kingdom)
Joaquim Figueiras, Univ. do Porto (Portugal)

Published in SPIE Proceedings Vol. 7650:
Health Monitoring of Structural and Biological Systems 2010
Tribikram Kundu, Editor(s)

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