Share Email Print
cover

Proceedings Paper

Pupil polarimetry using stress-engineered optical elements
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Stress-engineered optical elements show fascinating and potentially useful effects when placed at the pupil plane of an imaging system. When illuminated by a beam of spatially uniform polarization, a snapshot (single measurement) polarimetry method can be constructed. We expand upon this method to perform snapshot pupil polarimetry for spatially varying pupil polarization. We present the theory for snapshot non-uniform pupil polarization measurement using a stress-engineered optical element, as well as simulation results.

Paper Details

Date Published: 25 February 2010
PDF: 7 pages
Proc. SPIE 7570, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII, 757011 (25 February 2010); doi: 10.1117/12.848970
Show Author Affiliations
Amber M. Beckley, The Institute of Optics, Univ. Rochester (United States)
Thomas G. Brown, The Institute of Optics, Univ. Rochester (United States)


Published in SPIE Proceedings Vol. 7570:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

© SPIE. Terms of Use
Back to Top