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Proceedings Paper

Online analysis of sulfur in diesel line by a monochromatic wavelength dispersive x-ray fluorescence spectrometry
Author(s): Eduardo Pérez-Careta; Juan Antonio López-Ramírez; Gilberto Reynoso-Whitaker; Javier Sánchez-Mondragon; Miguel Torres-Cisneros
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Paper Abstract

This paper proposes the application of a monochromatic wavelength dispersive X-ray fluorescence (MWDXRF) technique developed in the X-ray Optical Systems laboratory Inc. The technique measures low-level sulfur (uls) in fuel. Data for ultra low sulfur in diesel were collected and analyzed using the combination of the mentioned technique and the usage of engineering tools as a fastloop array and a measurement technique. This provides a qualitative method for Diesel sulfur analysis of the Refinery Ing. Antonio M Amor (RIAMA) in Salamanca, Guanajuato. The pooled limit of quantification (PLOQ) for ultra-low-sulfur diesel was found to be less than 1.5 ppm in this study. The reproducibility of 15-ppm sulfur diesel fuel was determined to be better than 3 ppm (95 % confident level). This work shows the performance of the production of Diesel with less than 15-ppm in sulfur lines in the Hydrodesulfurizer Unit of Diesel (HDD) of the refinery. Results and conclusions discusses the better and cheaper method for the production of ultra low sulfur Diesel in the refinery.

Paper Details

Date Published: 4 December 2009
PDF: 6 pages
Proc. SPIE 7499, Seventh Symposium Optics in Industry, 74991E (4 December 2009); doi: 10.1117/12.848957
Show Author Affiliations
Eduardo Pérez-Careta, Refinery Ing. Antonio M. Amor (Mexico)
Univ. de Guanajuato (Mexico)
Juan Antonio López-Ramírez, Refinery Ing. Antonio M. Amor (Mexico)
Gilberto Reynoso-Whitaker, Refinery Ing. Antonio M. Amor (Mexico)
Javier Sánchez-Mondragon, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Miguel Torres-Cisneros, Univ. de Guanajuato (Mexico)


Published in SPIE Proceedings Vol. 7499:
Seventh Symposium Optics in Industry
Guillermo García Torales; Jorge L. Flores Núñez; Gilberto Gómez Rosas; Eric Rosas, Editor(s)

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