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Proceedings Paper

Two-band DMD-based infrared scene simulator
Author(s): Julia Rentz Dupuis; David J. Mansur; Robert Vaillancourt; Thomas Evans; David Carlson; Elizabeth Schundler
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Paper Abstract

OPTRA is developing a two-band midwave infrared (MWIR) scene projector based on digital micromirror device (DMD) technology; this projector is intended for training various IR tracking systems that exploit the relative intensities of two separate MWIR spectral bands. Our approach employs two DMDs, one for each spectral band, and an efficient optical design which overlays the scenes reflected by each through a common telecentric projector lens. Other key components are miniature thermal sources and a series of spectral filters. Through the use of pulse width modulation, we are able to control the relative intensities of objects simulated by the two channels thereby enabling realistic scene simulations of various targets and projectiles approaching the tracking system. Performance projections support radiant intensity levels, resolution, bandwidth, and scene durations that meet the requirements for a host of IR tracking test scenarios. In this paper we summarize the design and build and detail the system characterization of a prototype two-band projector. System characterization results include maximum radiant intensity, radiant intensity resolution, and angular resolution. We also present a series of projected images.

Paper Details

Date Published: 23 April 2010
PDF: 10 pages
Proc. SPIE 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV, 766302 (23 April 2010); doi: 10.1117/12.848772
Show Author Affiliations
Julia Rentz Dupuis, OPTRA, Inc. (United States)
David J. Mansur, OPTRA, Inc. (United States)
Robert Vaillancourt, OPTRA, Inc. (United States)
Thomas Evans, OPTRA, Inc. (United States)
David Carlson, OPTRA, Inc. (United States)
Elizabeth Schundler, OPTRA, Inc. (United States)


Published in SPIE Proceedings Vol. 7663:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
James A. Buford; Robert Lee Murrer, Editor(s)

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