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Proceedings Paper

Characterizing the self-sensing performance of carbon nanotube-enhanced fiber-reinforced polymers
Author(s): Bryan R. Loyola; Valeria La Saponara; Kenneth J. Loh
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Paper Abstract

The increased usage of fiber-reinforced polymers (FRP) in recent decades has created a need to monitor the unique response of these materials to impact and fatigue damage. As most traditional nondestructive evaluation methods are illsuited to detecting damage in FRPs, new methods must be created without compromising the high strength-to-weight aspects of FRPs. This paper describes the characterization of carbon nanotube-polyelectrolyte thin films applied to glass fiber substrates as a means for in situ strain sensing in glass fiber-reinforced polymers (GFRP). The layer-by-layer deposition process employed is capable of depositing individual and small bundles of carbon nanotubes within a polyelectrolyte matrix and directly onto glass fiber matrices. Upon film fabrication, the nanocomposite-coated GFRP specimens are mounted in a load frame for characterizing their electromechanical performance. This preliminary results obtained from this study has shown that these thin films exhibit bilinear piezoresistivity. Time- and frequency-domain techniques are utilized to characterize the nanocomposite strain sensing response. An equivalent circuit is also derived from electrical impedance spectroscopic analysis of thin film specimens.

Paper Details

Date Published: 25 March 2010
PDF: 12 pages
Proc. SPIE 7649, Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2010, 76490F (25 March 2010); doi: 10.1117/12.848712
Show Author Affiliations
Bryan R. Loyola, Univ. of California, Davis (United States)
Valeria La Saponara, Univ. of California, Davis (United States)
Kenneth J. Loh, Univ. of California, Davis (United States)


Published in SPIE Proceedings Vol. 7649:
Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2010
Peter J. Shull; Aaron A. Diaz; H. Felix Wu, Editor(s)

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