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Proceedings Paper

Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM)
Author(s): Sucbei Moon; Youngjae Won; Dug Young Kim
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Paper Abstract

We present a new high-speed lifetime measurement scheme of analog mean-delay (AMD) method which is suitable for studying dynamical time-resolved spectroscopy and high-speed fluorescence lifetime imaging microscopy (FLIM). In our lifetime measurement method, the time-domain intensity of a decaying fluorescence light source is acquired as an analog waveform, and the lifetime information of the source is extracted from the calculated mean temporal delay of the waveform.

Paper Details

Date Published: 25 November 2009
PDF: 8 pages
Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 750605 (25 November 2009); doi: 10.1117/12.848242
Show Author Affiliations
Sucbei Moon, Gwangju Institute of Science and Technology (Korea, Republic of)
Youngjae Won, Gwangju Institute of Science and Technology (Korea, Republic of)
Dug Young Kim, Gwangju Institute of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 7506:
2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Kimio Tatsuno, Editor(s)

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