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Proceedings Paper

Experimental investigation of prestress loss in RC beams
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Proc. SPIE 7648, Smart Sensor Phenomena, Technology, Networks, and Systems 2010, 76480R; doi: 10.1117/12.847960
Show Author Affiliations
Chunguang Lan, Harbin Institute of Technology (China)
Zhi Zhou, Harbin Institute of Technology (China)
Genda Chen, Missouri Univ. of Science and Technology (United States)
Jinping Ou, Harbin Institute of Technology (China)
Dalian Univ. of Technology (China)


Published in SPIE Proceedings Vol. 7648:
Smart Sensor Phenomena, Technology, Networks, and Systems 2010
Kara J. Peters; Wolfgang Ecke; Theodore E. Matikas, Editor(s)

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