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Proceedings Paper

Effect of strain on the electrical conductivity of a styrene-butadiene rubber
Author(s): Young Hee Kim; Jee Young Lim; Jobin Jose; Jae Young Kim; Gi-Bbeum Lee; Alan N. Gent; Changwoon Nah
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Paper Abstract

When the carbon black-filled rubbers are stretched, the electrical resistivity increases at lower extension ranges, and then it decreases with further extension. This complex behavior is attributed to the morphology changes of carbon black particles during extension, i.e., breaking and forming conducting paths. In this study, highly conductive carbon blacks were compounded with high styrene content SBR matrix with contents varying from 5phr, 10phr, 15phr and 20phr. All the compounds measured the electrical resistance at room temp., 40°C, 80°C, respectively. The electrical resistances are decreased as the conductive carbon blacks are higher and temperature is increased. The electrical resistivity and tensile behaviors were investigated as a function of stretching at 80°C. The conductive carbon black-filled a styrene-butadiene rubber vulcanizate showed much higher conductivity and the electrical resistivity is more stable by increase of contents. In tensile behaviors, as the contents of conductive carbon blacks increase, it shows the increase of strength.

Paper Details

Date Published: 9 April 2010
PDF: 8 pages
Proc. SPIE 7642, Electroactive Polymer Actuators and Devices (EAPAD) 2010, 76422V (9 April 2010); doi: 10.1117/12.847452
Show Author Affiliations
Young Hee Kim, Chonbuk National Univ. (Korea, Republic of)
Jee Young Lim, Chonbuk National Univ. (Korea, Republic of)
Jobin Jose, Chonbuk National Univ. (Korea, Republic of)
Jae Young Kim, Chonbuk National Univ. (Korea, Republic of)
Gi-Bbeum Lee, Chonbuk National Univ. (Korea, Republic of)
Alan N. Gent, Chonbuk National Univ. (Korea, Republic of)
The Univ. of Akron (United States)
Changwoon Nah, Chonbuk National Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 7642:
Electroactive Polymer Actuators and Devices (EAPAD) 2010
Yoseph Bar-Cohen, Editor(s)

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