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Proceedings Paper

A 5.5Mpixel 100 frames/sec wide dynamic range low noise CMOS image sensor for scientific applications
Author(s): Boyd Fowler; Chiao Liu; Steve Mims; Janusz Balicki; Wang Li; Hung Do; Jeff Appelbaum; Paul Vu
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Paper Abstract

In this paper we describe a 5.5Mpixel 100 frames/sec wide-dynamic-range low-noise CMOS image sensor (CIS) designed for scientific applications. The sensor has 6.5μm pitch 5T pixels with pinned photodiodes and integrated microlenses. The 5T pixel architecture enables low noise rolling and global shutter operation. The measured peak quantum efficiency of the sensor is greater than 55% at 550nm, the Nyquist MTF is greater than 0.4 at 550nm, and the linear full well capacity is greater than 35ke-. The measured rolling and global shutter readout noise are 1.28e- RMS and 2.54e- RMS respectively at 30 f/s and 20°C. The pinned photodiode dark current is less than 3.8pA/cm2 at 20°C. The sensor achieves an intra-scene linear dynamic range in rolling shutter operation of greater than 86dB (20000:1) at room temperature. In global shutter readout the shutter efficiency is greater than 1000:1 with 500nm illumination.

Paper Details

Date Published: 26 January 2010
PDF: 12 pages
Proc. SPIE 7536, Sensors, Cameras, and Systems for Industrial/Scientific Applications XI, 753607 (26 January 2010); doi: 10.1117/12.846975
Show Author Affiliations
Boyd Fowler, Fairchild Imaging (United States)
Chiao Liu, Fairchild Imaging (United States)
Steve Mims, Fairchild Imaging (United States)
Janusz Balicki, Fairchild Imaging (United States)
Wang Li, Fairchild Imaging (United States)
Hung Do, Fairchild Imaging (United States)
Jeff Appelbaum, Fairchild Imaging (United States)
Paul Vu, Fairchild Imaging (United States)


Published in SPIE Proceedings Vol. 7536:
Sensors, Cameras, and Systems for Industrial/Scientific Applications XI
Erik Bodegom; Valérie Nguyen, Editor(s)

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