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Proceedings Paper

Transient phase change in picosecond laser pulse-driven crystallization process of as-deposited amorphous thin films
Author(s): Y. Wang; F. Y. Zuo; H. Huang; F. X. Zhai; T. S. Lai; Y. Q. Wu
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Paper Abstract

Crystallization dynamics of as-deposited amorphous AgInSbTe and SiSb thin films induced by picosecond laser pulses with different fluences were studied using time-resolved reflectivity measurements. The transient phase change process during crystallization was discussed and compared.

Paper Details

Date Published: 23 October 2009
PDF: 8 pages
Proc. SPIE 7517, Photonics and Optoelectronics Meetings (POEM) 2009: Optical Storage and New Storage Technologies, 75170S (23 October 2009); doi: 10.1117/12.846908
Show Author Affiliations
Y. Wang, Shanghai Institute of Optics and Fine Mechanics (China)
F. Y. Zuo, Sun Yat-Sen Univ. (China)
H. Huang, Shanghai Institute of Optics and Fine Mechanics (China)
F. X. Zhai, Shanghai Institute of Optics and Fine Mechanics (China)
T. S. Lai, Sun Yat-Sen Univ. (China)
Y. Q. Wu, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 7517:
Photonics and Optoelectronics Meetings (POEM) 2009: Optical Storage and New Storage Technologies
Masud Mansuripur; Changsheng Xie; Xiangshui Miao, Editor(s)

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