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Proceedings Paper

Semiconductor quantum light emitters and sensors
Author(s): S. Höfling; T. Heindel; C. Kistner; C. Schneider; M. Lermer; S. Reitzenstein; M. Kamp; A. Forchel
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Paper Abstract

Quantum light emitters have great application potential in quantum key distribution, precision metrology and quantum imaging. We present triggered electrically driven single photon sources based on semiconductor quantum dots in GaAs/AlAs micropillar cavities with on demand single photon rates of 35 MHz while a record outcoupling efficiency up to 34 % is obtained. Photon autocorrelation measurements reveal g(2)(0) down to 0.13. The high efficiency is achieved due to an optimized contact scheme which allows for the injection of electrical current into micropillar cavities which are characterized by low absorption losses and diameters down to 1 μm. By exploiting the established fabrication procedure, micropillar cavities exhibiting pronounced cavity quantum electrodynamics effects have been realized. Furthermore, by applying a reverse bias to the micropillar cavities, photocurrent measurements allow for wavelength selective sensing of light at powers down to 20 nW and further design changes promise photon detection sensitivities approaching the quantum limit.

Paper Details

Date Published: 22 January 2010
PDF: 9 pages
Proc. SPIE 7608, Quantum Sensing and Nanophotonic Devices VII, 760804 (22 January 2010); doi: 10.1117/12.846856
Show Author Affiliations
S. Höfling, Julius-Maximilians-Univ. Würzburg (Germany)
T. Heindel, Julius-Maximilians-Univ. Würzburg (Germany)
C. Kistner, Julius-Maximilians-Univ. Würzburg (Germany)
C. Schneider, Julius-Maximilians-Univ. Würzburg (Germany)
M. Lermer, Julius-Maximilians-Univ. Würzburg (Germany)
S. Reitzenstein, Julius-Maximilians-Univ. Würzburg (Germany)
M. Kamp, Julius-Maximilians-Univ. Würzburg (Germany)
A. Forchel, Julius-Maximilians-Univ. Würzburg (Germany)


Published in SPIE Proceedings Vol. 7608:
Quantum Sensing and Nanophotonic Devices VII
Manijeh Razeghi; Rengarajan Sudharsanan; Gail J. Brown, Editor(s)

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