Share Email Print
cover

Proceedings Paper

Waveguides based on TeGe thick films for spatial interferometry
Author(s): Eléonore Barthélémy; Stéphanie Albert; Caroline Vigreux; Annie Pradel; Xiang-Hua Zhang; Shaoqian Zhang; Gilles Parent; Thierry Billeton; Jean-Emmanuel Broquin; Stéphane Ménard; Marc Barillot; Volker Kirschner
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In the present paper we focus on the fabrication of waveguides which will be able to work in the large infrared window [6-20μm], compatible with the ESA requirements in the framework of the detection of Exo-solar planets by nulling interferometry. The first step in the fabrication of such components is the realization of planar waveguides being able to guide light in this spectral range. In order to do so, telluride materials were selected: Te75Ge15Ga10 bulk glasses were chosen as substrates and TeGe films as guiding layers. The Te75Ge15Ga10 bulk glasses were purified during their synthesis which ensures an optimal transmission in the whole range from 6 to 20 μm. TeGe thick films with different compositions were deposited by thermal co-evaporation. Homogeneous films with thickness up to 15 microns could be produced. The M-lines measurement of their refractive index at λ = 10.6 μm highlighted a linear behavior versus the atomic percentage in tellurium and confirmed their compatibility for the project. First planar waveguides could be optically characterized after having prepared their input and output facets by an appropriate polishing procedure. Guidance of light was demonstrated in the whole range [6-20 μm].

Paper Details

Date Published: 12 February 2010
PDF: 10 pages
Proc. SPIE 7604, Integrated Optics: Devices, Materials, and Technologies XIV, 760405 (12 February 2010); doi: 10.1117/12.846022
Show Author Affiliations
Eléonore Barthélémy, Institut Charles Gerhardt, Univ. Montpellier 2 (France)
Stéphanie Albert, Institut Charles Gerhardt, Univ. Montpellier 2 (France)
Caroline Vigreux, Institut Charles Gerhardt, Univ. Montpellier 2 (France)
Annie Pradel, Institut Charles Gerhardt, Univ. Montpellier 2 (France)
Xiang-Hua Zhang, Sciences Chimiques de Rennes, Univ. de Rennes 1 (France)
Shaoqian Zhang, Sciences Chimiques de Rennes, Univ. de Rennes 1 (France)
Gilles Parent, Lab. d'Energétique et de Mécanique Théorique et Appliquée (France)
Thierry Billeton, Lab. de Physique des Lasers, Univ. Paris Nord (France)
Jean-Emmanuel Broquin, Institut de Microélectronique, Electromagnétique et Photonique (France)
Stéphane Ménard, Thales Alenia Space (France)
Marc Barillot, Thales Alenia Space (France)
Volker Kirschner, European Space Agency (Netherlands)


Published in SPIE Proceedings Vol. 7604:
Integrated Optics: Devices, Materials, and Technologies XIV
Jean-Emmanuel Broquin; Christoph M. Greiner, Editor(s)

© SPIE. Terms of Use
Back to Top