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Proceedings Paper

Emcore VCSEL failure mechanism and resolution
Author(s): Chun Lei; Neinyi Li; Chuan Xie; Rich Carson; Xinyu Sun; Wenlin Luo; Livia Zhao; Chris Helms; Dan Jensen; Chiyu Liu
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Paper Abstract

Extensive VCSEL reliability enhancements have been carried out at Emcore in the past year with significant results. In this talk, we will present the failure mechanisms, the method and effectiveness of wafer and die screening, and the approaches to eliminate these failure mechanisms. Results of improved reliability will also be discussed.

Paper Details

Date Published: 5 February 2010
PDF: 10 pages
Proc. SPIE 7615, Vertical-Cavity Surface-Emitting Lasers XIV, 761504 (5 February 2010); doi: 10.1117/12.845968
Show Author Affiliations
Chun Lei, EMCORE Corp. (United States)
Neinyi Li, EMCORE Corp. (United States)
Chuan Xie, EMCORE Corp. (United States)
Rich Carson, EMCORE Corp. (United States)
Xinyu Sun, EMCORE Corp. (United States)
Wenlin Luo, EMCORE Corp. (United States)
Livia Zhao, EMCORE Corp. (United States)
Chris Helms, EMCORE Corp. (United States)
Dan Jensen, EMCORE Corp. (United States)
Chiyu Liu, EMCORE Corp. (United States)

Published in SPIE Proceedings Vol. 7615:
Vertical-Cavity Surface-Emitting Lasers XIV
James K. Guenter; Kent D. Choquette, Editor(s)

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