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Proceedings Paper

Highly reliable data layout schemes for very large scale storage systems
Author(s): Dongjian Luo; Haifeng Zhong; Wei Wu
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Paper Abstract

In this paper, we investigate data layout schemes and their impact on system reliability in a petabyte scale storage system built from thousands of Object-Based Storage Devices. We delve in two underlying data layout schemes: RAID 5 and RAID 5 mirroring. To accelerate data reconstruction, Fast Mirroring Copy is employed where the reconstructed objects are stored on different OBSDs throughout the system. In order to improve the system reliability, SMART Reliability Mechanism (SRM) is introduced for enhancing the reliability in very large-scale storage system. Analysis results show that they can be used to assure the reliability of data storage and efficiently utilize the disk resource while exert minimum impact on the whole systems performance.

Paper Details

Date Published: 24 October 2009
PDF: 6 pages
Proc. SPIE 7517, Photonics and Optoelectronics Meetings (POEM) 2009: Optical Storage and New Storage Technologies, 75170T (24 October 2009); doi: 10.1117/12.845964
Show Author Affiliations
Dongjian Luo, Huazhong Univ. of Science and Technology (China)
Haifeng Zhong, Huazhong Univ. of Science and Technology (China)
Wei Wu, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7517:
Photonics and Optoelectronics Meetings (POEM) 2009: Optical Storage and New Storage Technologies

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