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Proceedings Paper

Spectrum analysis technique for measuring time delay of light in SOI micro-ring slow light device
Author(s): Di Yang; Yuntao Li; Zhongchao Fan; Xiao Chen; Shai Feng; Min Lv; Yuping Yang
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Paper Abstract

Spectrum analysis technique is introduced to measure the time delay of the silicon-on-insulator (SOI) micro-ring slow light device. The interference spectra of the TE and the TM polarization are obtained based on dual-quadrature spectral interferometry technique. By analyzing the observed spectral interference, the phase and time delay of the output optical pulse of SOI micro-ring is estimated. This method has a very high accuracy of time measurement because it avoids the impact of response speed of optoelectronic device, and moreover, it provides a complete measurement of the complex electric field as a continuous function of frequency.

Paper Details

Date Published: 26 October 2009
PDF: 5 pages
Proc. SPIE 7516, Photonics and Optoelectronics Meetings (POEM) 2009: Optoelectronic Devices and Integration, 75160S (26 October 2009); doi: 10.1117/12.844918
Show Author Affiliations
Di Yang, Central Univ. for Nationalities (China)
Yuntao Li, Semiconductor Institute (China)
Zhongchao Fan, Semiconductor Institute (China)
Xiao Chen, Central Univ. for Nationalities (China)
Shai Feng, Central Univ. for Nationalities (China)
Min Lv, Central Univ. for Nationalities (China)
Yuping Yang, Central Univ. for Nationalities (China)

Published in SPIE Proceedings Vol. 7516:
Photonics and Optoelectronics Meetings (POEM) 2009: Optoelectronic Devices and Integration
Zishen Zhao; Ray T. Chen; Yong Chen; Jinzhong Yu; Junqiang Sun; Weiwei Dong, Editor(s)

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