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Proceedings Paper

A variational approach for the correction of field-inhomogeneities in EPI sequences
Author(s): Janine Olesch; Lars Ruthotto; Harald Kugel; Stefan Skare; Bernd Fischer; Carsten H. Wolters
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Paper Abstract

A wide range of medical applications in clinic and research exploit images acquired by fast magnetic resonance imaging (MRI) sequences such as echo-planar imaging (EPI), e.g. functional MRI (fMRI) and diffusion tensor MRI (DT-MRI). Since the underlying assumption of homogeneous static fields fails to hold in practical applications, images acquired by those sequences suffer from distortions in both geometry and intensity. In the present paper we propose a new variational image registration approach to correct those EPI distortions. To this end we acquire two reference EPI images without diffusion sensitizing and with inverted phase encoding gradients in order to calculate a rectified image. The idea is to apply a specialized registration scheme which compensates for the characteristical direction dependent image distortions. In addition the proposed scheme automatically corrects for intensity distortions. This is done by evoking a problem dependent distance measure incorporated into a variational setting. We adjust not only the image volumes but also the phase encoding direction after correcting for patients head-movements between the acquisitions. Finally, we present first successful results of the new algorithm for the registration of DT-MRI datasets.

Paper Details

Date Published: 12 March 2010
PDF: 8 pages
Proc. SPIE 7623, Medical Imaging 2010: Image Processing, 76230K (12 March 2010); doi: 10.1117/12.844375
Show Author Affiliations
Janine Olesch, Univ. of Lübeck (Germany)
Lars Ruthotto, Univ. of Münster (Germany)
Harald Kugel, Univ. of Münster (Germany)
Stefan Skare, Stanford Univ. (United States)
Bernd Fischer, Univ. of Lübeck (Germany)
Carsten H. Wolters, Univ. of Münster (Germany)

Published in SPIE Proceedings Vol. 7623:
Medical Imaging 2010: Image Processing
Benoit M. Dawant; David R. Haynor, Editor(s)

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