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Proceedings Paper

Image quality comparison of high-energy phase contrast x-ray images with low-energy conventional images: phantom studies
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Paper Abstract

A significant challenge in the field of mammography that has yet to be overcome involves providing adequate image quality for detection and diagnosis, while minimizing the radiation dose to the patient. An emerging x-ray technology, high energy phase contrast imaging holds the potential to reduce the patient dose without compromising the image quality, which would benefit the early detection of breast cancer. The purpose of this preliminary study was to compare the image quality of high energy phase contrast images to conventional x-ray images at typical mammography energies. The experimental settings were selected to provide similar entrance exposures for the high and low energy images. Several phantoms were utilized in this study to provide a comprehensive image quality comparison, in an effort to investigate the clinical potential of high energy phase contrast imaging. An ACR phantom was utilized for quantitative comparison through an observer study, while a new tissue-equivalent phantom was utilized for a qualitative investigation. Finally, an acrylic-edge phantom was employed to provide an illustration of the edge enhancement in the phase contrast images as compared to the conventional images. The results from the multi-faceted comparison indicate the potential of high energy phase contrast imaging to provide comparable image quality at a similar or decreased patient dose.

Paper Details

Date Published: 23 February 2010
PDF: 9 pages
Proc. SPIE 7563, Dynamics and Fluctuations in Biomedical Photonics VII, 756305 (23 February 2010); doi: 10.1117/12.844252
Show Author Affiliations
Molly Wong, Univ. of Oklahoma (United States)
Xizeng Wu, Univ. of Alabama at Birmingham (United States)
Hong Liu, Univ. of Oklahoma (United States)

Published in SPIE Proceedings Vol. 7563:
Dynamics and Fluctuations in Biomedical Photonics VII
Valery V. Tuchin; Donald D. Duncan; Kirill V. Larin, Editor(s)

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