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Proceedings Paper

Composition of SIFT features for robust image representation
Author(s): Ignazio Infantino; Giovanni Spoto; Filippo Vella; Salvatore Gaglio
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Paper Abstract

In this paper we propose a novel feature based on SIFT (Scale Invariant Feature Transform) algorithm1 for the robust representation of local visual contents. SIFT features have raised much interest for their power of description of visual content characterizing punctual information against variation of luminance and change of viewpoint and they are very useful to capture local information. For a single image hundreds of keypoints are found and they are particularly suitable for tasks dealing with image registration or image matching. In this work we stretched the spatial coverage of descriptors creating a novel feature as composition of keypoints present in an image region while maintaining the invariance properties of SIFT descriptors. The number of descriptors is reduced, limiting the computational weight, and at the same time a more abstract descriptor is achieved. The new feature is therefore suitable at describing objects and characteristic image regions. We tested the retrieval performance with a dataset used to test PCA SIFT2 and image matching capability among images processed with affine transformations. Experimental results are reported.

Paper Details

Date Published: 10 February 2010
PDF: 7 pages
Proc. SPIE 7540, Imaging and Printing in a Web 2.0 World; and Multimedia Content Access: Algorithms and Systems IV, 754016 (10 February 2010); doi: 10.1117/12.843540
Show Author Affiliations
Ignazio Infantino, Consiglio Nazionale delle Ricerche (Italy)
Giovanni Spoto, Univ. degli Studi di Palermo (Italy)
Filippo Vella, Consiglio Nazionale delle Ricerche (Italy)
Salvatore Gaglio, Consiglio Nazionale delle Ricerche (Italy)
Univ. degli Studi di Palermo (Italy)


Published in SPIE Proceedings Vol. 7540:
Imaging and Printing in a Web 2.0 World; and Multimedia Content Access: Algorithms and Systems IV
Theo Gevers; Qian Lin; Raimondo Schettini; Zhigang Fan; Cees Snoek, Editor(s)

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