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Birefringence and formed birefringence in photonic crystal line waveguidesFormat | Member Price | Non-Member Price |
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Paper Abstract
The birefringence of two-dimensional photonic crystal line defect waveguides, which is larger than that of the
conventional dielectric waveguides, is numerically investigated by finite-difference time-domain scheme and spatial
Fourier transform method. The birefringence line waveguides are more suitable for polarization phase engineering than
the bulk perfect photonic crystal structure because they provide low beam divergence and light transmission loss. The
zeroth-order quarter- and half-wave plates based on the two-dimensional photonic crystal line waveguide have merits of
high transmission efficiency and low interference with other components in photonic integrated circuits. Moreover, the
designed zeroth-order wave plates have achromatic characteristic with high phase accuracy ( ±0.012π ) in a large
frequency range (about 16 nm) around the telecommunication band (1550 nm). In addition, for realizing the relatively
high order wave plates, the formed birefringence method is introduced in detail. The physical mechanism of formed
birefringence is bringing path difference between two different polarizations. Based on the formed birefringence, the
relative high-order (about 80th-order) WP is achieved by line-defect photonic crystal waveguides. The wave plates
presented in this letter have many potential applications in future photonic integrated circuits such as integrated optical
communications, polarization control and integrated depolarizing.
Paper Details
Date Published: 26 October 2009
PDF: 7 pages
Proc. SPIE 7516, Photonics and Optoelectronics Meetings (POEM) 2009: Optoelectronic Devices and Integration, 751603 (26 October 2009); doi: 10.1117/12.843462
Published in SPIE Proceedings Vol. 7516:
Photonics and Optoelectronics Meetings (POEM) 2009: Optoelectronic Devices and Integration
Zishen Zhao; Ray T. Chen; Yong Chen; Jinzhong Yu; Junqiang Sun; Weiwei Dong, Editor(s)
PDF: 7 pages
Proc. SPIE 7516, Photonics and Optoelectronics Meetings (POEM) 2009: Optoelectronic Devices and Integration, 751603 (26 October 2009); doi: 10.1117/12.843462
Show Author Affiliations
Wenfu Zhang, Xi'an Institute of Optics and Precision Mechanics (China)
Graduate School of the Chinese Academy of Sciences (China)
Jihong Liu, Xi'an Institute of Post and Telecommunications (China)
Graduate School of the Chinese Academy of Sciences (China)
Jihong Liu, Xi'an Institute of Post and Telecommunications (China)
Wei-Ping Huang, McMaster Univ. (Canada)
Wei Zhao, Xi'an Institute of Optics and Precision Mechanics (China)
Wei Zhao, Xi'an Institute of Optics and Precision Mechanics (China)
Published in SPIE Proceedings Vol. 7516:
Photonics and Optoelectronics Meetings (POEM) 2009: Optoelectronic Devices and Integration
Zishen Zhao; Ray T. Chen; Yong Chen; Jinzhong Yu; Junqiang Sun; Weiwei Dong, Editor(s)
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