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Proceedings Paper

Near-infrared spectroscopy and pattern recognition techniques applied to the identification of Jinhua ham
Author(s): Honglian Li; Zhilei Zhao; Yanping Pang; Yanfeng Wang; Xiaoting Li
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Paper Abstract

Near-infrared (NIR) diffuse reflectance spectroscopy and pattern recognition techniques are applied to develop a fast identification method of Jinhua ham. The samples are collected from different manufactures and they are nineteen Jinhua ham samples and four Xuanwei ham samples. NIR spectra are pretreated with second derivative calculation and vector normalization. The pattern recognition techniques which are cluster analysis, conformity test and principal component analysis (PCA) are separately used to qualify Jinhua ham. The three methods can all distinguish Jinhua ham successfully. The result indicated that a 100 % recognition ration is achieved by the methods and the PCA method is the best one. Overall, NIR reflectance spectroscopy using pattern recognition is shown to have significant potential as a rapid and accurate method for identification of ham.

Paper Details

Date Published: 30 November 2009
PDF: 8 pages
Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 750612 (30 November 2009); doi: 10.1117/12.843357
Show Author Affiliations
Honglian Li, Hebei Univ. (China)
Zhilei Zhao, Hebei Univ. (China)
Yanping Pang, Hebei Univ. (China)
Yanfeng Wang, China National Institute of Standardization (China)
Xiaoting Li, Hebei Univ. (China)


Published in SPIE Proceedings Vol. 7506:
2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Kimio Tatsuno, Editor(s)

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