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Proceedings Paper

Spaceborne laser instruments for high-resolution mapping
Author(s): Anthony W. Yu; Michael A. Krainak; David J. Harding; James B. Abshire; Xiaoli Sun; Susan Valett; John Cavanaugh; Luis Ramos-Izquierdo
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Paper Abstract

We discuss past, present and future spaceborne laser instruments for high-resolution mapping of Earth and planetary surfaces. Previous spaceborne-laser-altimeters projected and imaged a single laser spot for surface-height measurements. In contrast, the recent Lunar Orbiter Laser Altimeter (LOLA) instrument on the Lunar Reconnaissance Orbiter (LRO) uses a non-scanning multi-beam system for surface topography mapping. The multi-beam instrument facilitates surface slope measurement and reduces the time-to-completion for global high-resolution topographic mapping. We discuss our first-year progress on a three-year swath-mapping laser-altimetry Instrument Incubator Program (IIP) funded by the NASA Earth Science Technology Office (ESTO). Our IIP is a technology development program supporting the LIdar Surface Topography (LIST) space-flight mission that is a third-tier mission as recommended by the National Research Council (NRC) for NASA's Earth Science programs.

Paper Details

Date Published: 17 February 2010
PDF: 12 pages
Proc. SPIE 7578, Solid State Lasers XIX: Technology and Devices, 757802 (17 February 2010); doi: 10.1117/12.843191
Show Author Affiliations
Anthony W. Yu, NASA Goddard Space Flight Ctr. (United States)
Michael A. Krainak, NASA Goddard Space Flight Ctr. (United States)
David J. Harding, NASA Goddard Space Flight Ctr. (United States)
James B. Abshire, NASA Goddard Space Flight Ctr. (United States)
Xiaoli Sun, NASA Goddard Space Flight Ctr. (United States)
Susan Valett, NASA Goddard Space Flight Ctr. (United States)
John Cavanaugh, NASA Goddard Space Flight Ctr. (United States)
Luis Ramos-Izquierdo, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 7578:
Solid State Lasers XIX: Technology and Devices
W. Andrew Clarkson; Norman Hodgson; Ramesh K. Shori, Editor(s)

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