Share Email Print
cover

Proceedings Paper

New developments in STED microscopy
Author(s): Arnold Giske; Jochen Sieber; Hilmar Gugel; Marcus Dyba; Volker Seyfried; Dietmar Gnass
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

STED microscopy has gained recognition as a method to break the diffraction limit of conventional light microscopy. Despite being a new technique, STED is already successfully implemented in life science research. The resolution enhancement is achieved by depleting fluorescent markers via stimulated emission. The performance is significantly dependent on the laser source and the fluorescence markers. Therefore the use of novel fluorescent markers in conjunction with the right laser system was the main focus of our research. We present new developments and applications of STED microscopy, unraveling structural details on scales below 90nm and give an overview of required specifications for the solid state laser systems.

Paper Details

Date Published: 17 February 2010
PDF: 6 pages
Proc. SPIE 7578, Solid State Lasers XIX: Technology and Devices, 75781X (17 February 2010); doi: 10.1117/12.843156
Show Author Affiliations
Arnold Giske, Leica Microsystems CMS (Germany)
Jochen Sieber, Leica Microsystems CMS (Germany)
Hilmar Gugel, Leica Microsystems CMS (Germany)
Marcus Dyba, Leica Microsystems CMS (Germany)
Volker Seyfried, Leica Microsystems CMS (Germany)
Dietmar Gnass, Leica Microsystems CMS (Germany)


Published in SPIE Proceedings Vol. 7578:
Solid State Lasers XIX: Technology and Devices
W. Andrew Clarkson; Norman Hodgson; Ramesh K. Shori, Editor(s)

© SPIE. Terms of Use
Back to Top