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Proceedings Paper

Self-reference extended depth-of-field quantitative phase microscopy
Author(s): Jaeduck Jang; Chae Yun Bae; Je-Kyun Park; Jong Chul Ye
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Paper Abstract

This paper describes a novel quantitative phase microscopy based on a simple self-referencing scheme using Michelson interferometry. In order to achieve the homogeneous reference field for accurate phase measurement, the imaging field-of-view (FOV) is split onto the sample and homogenous background areas. The reference field can be generated by rotating the relative position of the sample and homogenous background in the object arm. Furthermore, our system is realized using an extended depth-of-field (eDOF) optics, which allows quantitative phase measurement for an increase of the depth-of-field without moving objective lens or specimen. The proposed method is confirmed by experimental results using various samples such as polystyrene beads and red blood cells (RBCs).

Paper Details

Date Published: 25 February 2010
PDF: 8 pages
Proc. SPIE 7570, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII, 757018 (25 February 2010); doi: 10.1117/12.843082
Show Author Affiliations
Jaeduck Jang, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Chae Yun Bae, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Je-Kyun Park, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Jong Chul Ye, Korea Advanced Institute of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 7570:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

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