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Proceedings Paper

A metal-dielectric thin film with broadband absorption
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Paper Abstract

We propose and demonstrate a metal-dielectric thin film that delivers low reflection and high absorption over the entire visible spectrum. This thin black film consists of SiO2/Cr/SiO2/Al layers deposited on glass substrate. Measured reflectance and absorptance of the black film are 0.7% and 99.3%, respectively, when averaged over the range 380-780 nm. The total thickness of the black film is only about 220 nm. This thin black film can be used as a thin absorbing layer for displays that require both broadband anti-reflection and high contrast characteristics.

Paper Details

Date Published: 12 February 2010
PDF: 9 pages
Proc. SPIE 7618, Emerging Liquid Crystal Technologies V, 761819 (12 February 2010); doi: 10.1117/12.843067
Show Author Affiliations
Sang-Hwan Cho, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Ju-Hyung Kang, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Min-Kyo Seo, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Jin-Kyu Yang, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Sung-Yong Kang, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Yong-Hee Lee, Korea Advanced Institute of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 7618:
Emerging Liquid Crystal Technologies V
Liang-Chy Chien, Editor(s)

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