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Proceedings Paper

High-power high-brightness 808nm QCW laser diode mini bars
Author(s): Hua Huang; Jun Wang; Mark DeVito; Ling Bao; Aaron Hodges; Shiguo Zhang; Damian Wise; Mike Grimshaw; Dapeng Xu; Chendong Bai
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Paper Abstract

A new class of high power high brightness 808 nm QCW laser diode mini bars has been developed. With nLight's nXLT facet passivation technology and improvements in epitaxial structure, mini bars of 3 mm bar width with high efficiency design have tested to over 280 W peak power with peak efficiency over 64% on conduction cooled CS packages, equivalent to output power density near 130 mW/μm. These mini laser bars open up new applications as compact, portable, and low current pump sources. Liftests have been carried out on conduction cooled CS packages and on QCW stacks. Over 370 million (M) shots lifetest with high efficiency design has been demonstrated on CS so far without failure, and over 80 M shots on QCW stacks with accelerated stress lifetest have also proven high reliability on mini bars with high temperature design. Failure analysis determined that the failure mechanism was related to bulk defects, showing that mini laser bars are not prone to facet failure, which is consistent with the large current pulse test and failure analysis on high power single emitters.

Paper Details

Date Published: 17 February 2010
PDF: 8 pages
Proc. SPIE 7583, High-Power Diode Laser Technology and Applications VIII, 75831A (17 February 2010); doi: 10.1117/12.842859
Show Author Affiliations
Hua Huang, nLIGHT Corp. (United States)
Jun Wang, nLIGHT Corp. (United States)
Mark DeVito, nLIGHT Corp. (United States)
Ling Bao, nLIGHT Corp. (United States)
Aaron Hodges, nLIGHT Corp. (United States)
Shiguo Zhang, nLIGHT Corp. (United States)
Damian Wise, nLIGHT Corp. (United States)
Mike Grimshaw, nLIGHT Corp. (United States)
Dapeng Xu, nLIGHT Corp. (United States)
Chendong Bai, nLIGHT Corp. (United States)

Published in SPIE Proceedings Vol. 7583:
High-Power Diode Laser Technology and Applications VIII
Mark S. Zediker, Editor(s)

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