Share Email Print
cover

Proceedings Paper

Optical design of a snapshot high-sampling image mapping spectrometer (IMS) for hyperspectral microscopy
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A snapshot high-sampling Image Mapping Spectrometer (IMS) is developed for hyperspectral microscopy, measuring datacube of dimensions 285x285x60 (x, y, λ). Microscopy IMS is designed to work at the Nyquist sampling limit to realize high resolution imaging. The spatial resolution is ~0.45μm with FOV ~130μm. The spectral working range is 500-700nm with ~8.3nm average spectral resolution. Preliminary tests have been implemented on its imaging performances.

Paper Details

Date Published: 26 February 2010
PDF: 7 pages
Proc. SPIE 7570, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII, 75700Z (26 February 2010); doi: 10.1117/12.842686
Show Author Affiliations
Liang Gao, Rice Univ. (United States)
Robert Kester, Rice Univ. (United States)
Tomasz Tkaczyk, Rice Univ. (United States)


Published in SPIE Proceedings Vol. 7570:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

© SPIE. Terms of Use
Back to Top