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Proceedings Paper

FDTD simulation of metallic gratings for enhancement of electromagnetic field by surface plasmon resonance
Author(s): Hari P. Paudel; Khadijeh Bayat; Mahdi Farrokh Baroughi; Stanley May; David W. Galipeau
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Paper Abstract

Enhancement of electromagnetic field by two dimensional arrays of rectangular and cylindrical nanopillars of both gold and silver metals arranged in either square or triangular lattices was investigated. We simulated these gratings by 3D Finite Difference Time Domain (3D-FDTD) method in visible and near infrared (NIR) wavelengths regime and investigated field enhancement by exciting surface plasmon polaritons (SPPs) as a function of geometrical parameters of grating. It was found that the geometrical grating parameters such as period, shape, thickness and size can be tuned for excitation of SPPs at particular frequency of interest. The tuned grating would lead to an electric field intensity enhancement by greater than 100× near the grating surface due to excitation of SPPs. Cylindrical gratings tuned for 750 nm at zero degree incident angle showed that the thickness of grating is the most sensitive geometrical parameter of resonance. Furthermore, triangular lattice gratings have wider bandwidth of resonance than square lattice gratings. Meanwhile, wavelength versus incident angle diagram showed that the enhancement was highly sensitive with angle of incidence.

Paper Details

Date Published: 26 February 2010
PDF: 8 pages
Proc. SPIE 7597, Physics and Simulation of Optoelectronic Devices XVIII, 759706 (26 February 2010); doi: 10.1117/12.842590
Show Author Affiliations
Hari P. Paudel, South Dakota State Univ. (United States)
Khadijeh Bayat, South Dakota State Univ. (United States)
Mahdi Farrokh Baroughi, South Dakota State Univ. (United States)
Stanley May, Univ. of South Dakota (United States)
David W. Galipeau, South Dakota State Univ. (United States)


Published in SPIE Proceedings Vol. 7597:
Physics and Simulation of Optoelectronic Devices XVIII
Bernd Witzigmann; Fritz Henneberger; Yasuhiko Arakawa; Marek Osinski, Editor(s)

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