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Proceedings Paper

Measuring structural features using a dual window method for light scattering spectroscopy and Fourier-domain low coherence interferometry
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Paper Abstract

Light scattering spectroscopy (LSS) and Fourier domain low coherence interferometry (fLCI) are used in combination with the dual window method (DW) to measure scattering features from a thick turbid sample. By processing with the DW method, the trade off that hinders spectroscopic OCT is avoided, thus yielding depth resolved spectra with simultaneously high spatial and spectral resolution. The capabilities of the method are demonstrated by analyzing a double layer phantom, where the top layer contains polystyrene beads of diameter d = 4.00 μm, and the bottom layer contains beads of d = 6.98 μm. A white light parallel frequency domain OCT system is used to image the sample. The results show that scattering structure can be assessed accurately and precisely throughout the whole OCT image using LSS and fLCI.

Paper Details

Date Published: 26 February 2010
PDF: 4 pages
Proc. SPIE 7573, Biomedical Applications of Light Scattering IV, 757310 (26 February 2010); doi: 10.1117/12.842375
Show Author Affiliations
Francisco E. Robles, Duke Univ. (United States)
Adam Wax, Duke Univ. (United States)


Published in SPIE Proceedings Vol. 7573:
Biomedical Applications of Light Scattering IV
Adam P. Wax; Vadim Backman, Editor(s)

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