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Proceedings Paper

An artifact-metrics which utilizes laser speckle patterns for plastic ID card surface
Author(s): Manabu Yamakoshi; Xiaoying Rong; Tsutomu Matsumoto
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Paper Abstract

Artifact-metrics is an automated method of authenticating artifacts based on their measurable intrinsic characteristics such as microscopic random-patterns and the like which are emerging in their manufacturing process. They are very difficult to copy and control even for legal manufacturers. This paper describes the feasibility of an artifact-metric system using laser speckle patterns of the surface of security documents. Speckle patterns of the surface differ from each object depending on their microscopic geometry; they can be authenticated automatically by some matching algorithm that compares the input with the previously enrolled data. Our system consists of a laser diode and a CMOS camera which are attached firmly to a rigid metal frame and a matching algorithm by correlation coefficient method. To improve matching accuracy we investigate the influence of width and incident angle of the laser beam and aperture size and shooting angle for the camera on the matching accuracy through matching tests using 100 of ID cards. As a result, we found that aperture size of the camera and width of the laser are part of important factors for matching accuracy. Also, we achieved equal error rate of 0.1% using data size of 16 square pixels for speckle patterns.

Paper Details

Date Published: 12 February 2010
PDF: 8 pages
Proc. SPIE 7618, Emerging Liquid Crystal Technologies V, 76180B (12 February 2010); doi: 10.1117/12.842237
Show Author Affiliations
Manabu Yamakoshi, National Printing Bureau (Japan)
California Polytechnic State Univ. (United States)
Xiaoying Rong, California Polytechnic State Univ. (United States)
Tsutomu Matsumoto, Yokohama National Univ. (Japan)


Published in SPIE Proceedings Vol. 7618:
Emerging Liquid Crystal Technologies V
Liang-Chy Chien, Editor(s)

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