Share Email Print
cover

Proceedings Paper

Integrated photonic circuit in silicon on insulator for Fourier domain optical coherence tomography
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Optical coherence tomography (OCT) is a medical imaging technology capable of producing high-resolution, crosssectional images through inhomogeneous samples, such as biological tissue. It has been widely adopted in clinical ophthalmology and a number of other clinical applications are in active research. Other applications of OCT include material characterization and non-destructive testing. In addition to current uses, OCT has a potential for a much wider range of applications and further commercialization. One of the reasons for slow penetration of OCT in clinical and industrial use is probably the cost and the size of the current systems. Current commercial and research OCT systems are fiber/free space optics based. Although fiber and micro-optical components have made these systems portable, further significant miniaturization and cost reduction could be achieved through the use of integrated photonic components. We demonstrate a Michelson interferometer using integrated photonic waveguides on nanophotonic silicon on insulator platform. The size of the interferometer is 1500 μm x 50 μm. The structure has been tested using a mirror as a reflector. We can achieve 40 μm axial resolution and 25 dB sensitivity which can be substantially improved.

Paper Details

Date Published: 23 February 2010
PDF: 5 pages
Proc. SPIE 7554, Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XIV, 75541B (23 February 2010); doi: 10.1117/12.841702
Show Author Affiliations
Gunay Yurtsever, Ghent Univ. (Belgium)
Pieter Dumon, Ghent Univ. (Belgium)
Wim Bogaerts, Ghent Univ. (Belgium)
Roel Baets, Ghent Univ. (Belgium)


Published in SPIE Proceedings Vol. 7554:
Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XIV
Joseph A. Izatt; James G. Fujimoto; Valery V. Tuchin, Editor(s)

© SPIE. Terms of Use
Back to Top