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Proceedings Paper

Noise-reduction in fringe patterns based on the empirical mode decomposition
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Paper Abstract

Phase-extraction from fringe patterns is an inevitable procedure in many applications, such as interferometry, Moiré analysis, and profilometry using structured light illumination. Errors to phase-extraction always occur when the signal-to- noise ratio is weak. In this paper, we use the empirical mode decomposition (EMD) with a generalized analysis model to reduce the white noise from a fringe pattern. It is found that phases can be extracted with high accuracy once noise-reduction is performed with this model.

Paper Details

Date Published: 8 February 2010
PDF: 9 pages
Proc. SPIE 7613, Complex Light and Optical Forces IV, 76130V (8 February 2010); doi: 10.1117/12.841515
Show Author Affiliations
Wei-Hung Su, National Sun Yat-Sen Univ. (Taiwan)
Chao-Kuei Lee, National Sun Yat-Sen Univ. (Taiwan)
Chen-Wei Lee, National Sun Yat-Sen Univ. (Taiwan)

Published in SPIE Proceedings Vol. 7613:
Complex Light and Optical Forces IV
Enrique J. Galvez; David L. Andrews; Jesper Glückstad, Editor(s)

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