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Proceedings Paper

Stationary Wave Integrated Fourier Transform Spectrometer (SWIFTS)
Author(s): Jérôme Ferrand; Guillaume Custillon; Gregory Leblond; Fabrice Thomas; Thibault Moulin; Etienne le Coarer; Alain Morand; Sylvain Blaize; Thierry Gonthiez; Pierre Benech
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Paper Abstract

The size and the weight of current spectrometers is a serious issue regarding various applications, however the technologies used in existing spectrometers prevent them from substantial improvement. SWIFTS (Stationary Wave Integrated Fourier Transform Spectrometer) is a new familyof spectrometers based on a verypromising technology. It is based on an original wayto fully sample the Fourier interferogram obtained in a waveguide byeither a reflection (SWIFTS Lippmann) or counter-propagative (SWIFTS Gabor) interference phenomenon. The sampling can be simultaneouslydone without anymo ving part thanks to "nano-detectors" located in the evanescent field of the waveguide. It allows a dramatic reduction of the size and the weight of spectrometers while improving their performances (high stabilityand high resolution δσ < 1cm-1). Here, we present the development status of the SWIFTS Gabor and the results obtained (resolution of 4cm-1) with existing technical solutions for the "nano-detectors" in visible and near infrared.

Paper Details

Date Published: 11 February 2010
PDF: 9 pages
Proc. SPIE 7604, Integrated Optics: Devices, Materials, and Technologies XIV, 760414 (11 February 2010); doi: 10.1117/12.841349
Show Author Affiliations
Jérôme Ferrand, LAOG, UJF-CNRS (France)
Guillaume Custillon, IMEP-LAHC, INPG-UJF-CNRS (France)
Gregory Leblond, LNIO, UTT (France)
Fabrice Thomas, LAOG, UJF-CNRS (France)
Thibault Moulin, LAOG, UJF-CNRS (France)
Etienne le Coarer, LAOG, UJF-CNRS (France)
Alain Morand, IMEP-LAHC, INPG-UJF-CNRS (France)
Sylvain Blaize, LNIO, UTT (France)
Thierry Gonthiez, Floralis (France)
Pierre Benech, IMEP-LAHC, INPG-UJF-CNRS (France)

Published in SPIE Proceedings Vol. 7604:
Integrated Optics: Devices, Materials, and Technologies XIV
Jean-Emmanuel Broquin; Christoph M. Greiner, Editor(s)

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