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Proceedings Paper

Type II heterostructures with InSb quantum dots inserted into p-n InAs(Sb,P) junction
Author(s): K. D. Moiseev; Ya. A. Parkhomenko; E. V. Ivanov; S. S. Kizhaev; M. P. Mikhailova; V. N. Nevedomsky; N. A. Bert; Yu. P. Yakovlev
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Paper Abstract

We report on study of electrical and optical properties of type II heterostructures with InSb quantum dots (QDs) inserter into the InAs-based p-n junction made by LPE-MOVPE combine method. InSb QDs were grown on an InAs(100) substrate by LPE. Overgrowth on the surface with the self-assembled InSb QD arrays was performed by MOVPE using capping layers based on binary InAs and quaternary InAsSb solid solutions. High-resolution cross-sectional image of the InSb QDs buried into the InAs(Sb,P) matrix was obtained for the first time by transmission electron microscopy. Structural parameters of the InSb QDs such as size, shape and internal strain were demonstrated and discussed. The uniform small QDs with high density (>1010 cm-2) with dimensions of 3 nm in height and 14 nm in diameter were found to be self-assembled and dislocation-free without any extended defects, whereas the low-density large QDs (108 cm-2) with dimensions of 10 nm in height and 50 nm in diameter were relaxed and demonstrated interface strain with the InAs substrate. I-V characteristics of the mesa-diode heterostructures with the InSb QDs inserted into InAs p-n junction were studied at the wide temperature range T=77-300 K. Intense positive and negative electroluminescence for both n-InAs/p- InAs and n-InAs/InSb-QDs/p-InAs heterostructures was found in the spectral range 3-4 μm. Evolution of the spectra in dependence on applied external bias (forward and reverse) were observed at 77 K and 300 K.

Paper Details

Date Published: 22 January 2010
PDF: 13 pages
Proc. SPIE 7608, Quantum Sensing and Nanophotonic Devices VII, 76081R (22 January 2010); doi: 10.1117/12.841160
Show Author Affiliations
K. D. Moiseev, Ioffe Physico-Technical Institute (Russian Federation)
Ya. A. Parkhomenko, Ioffe Physico-Technical Institute (Russian Federation)
E. V. Ivanov, Ioffe Physico-Technical Institute (Russian Federation)
S. S. Kizhaev, Ioffe Physico-Technical Institute (Russian Federation)
M. P. Mikhailova, Ioffe Physico-Technical Institute (Russian Federation)
V. N. Nevedomsky, Ioffe Physico-Technical Institute (Russian Federation)
N. A. Bert, Ioffe Physico-Technical Institute (Russian Federation)
Yu. P. Yakovlev, Ioffe Physico-Technical Institute (Russian Federation)

Published in SPIE Proceedings Vol. 7608:
Quantum Sensing and Nanophotonic Devices VII
Manijeh Razeghi; Rengarajan Sudharsanan; Gail J. Brown, Editor(s)

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