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Proceedings Paper

Ultra-high sensitivity photodetector arrays with integrated amplification and passivation nano-layers
Author(s): Jie Yao; Irina A. Mokina; Feng Liu; Sean Wang; Jack Zhou; Michael Lange; Weiguo Yang; Patrick Gardner; Leora Peltz; Robert Frampton; Jeffrey H. Hunt
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Paper Abstract

Miniaturized field-deployable spectrometers used for the rapid analysis of chemical and biological substances require high-sensitivity photo detectors. For example, in a Raman spectroscopy system, the receiver must be capable of high-gain, low-noise detection performance due to the intrinsically weak signals produced by the Raman effects of most substances. We are developing a novel, high-gain hetero-junction phototransistor (HPT) detector which employs two nano-structures simultaneously to achieve 100 times higher sensitivity than InGaAs avalanche photodiodes, the most sensitive commercially available photo-detector in the near infrared (NIR) wavelength range, under their normal operation conditions. Integrated into a detector array, this technology has application for Laser-Induced Breakdown Spectroscopy (LIBS), pollution monitoring, pharmaceutical manufacturing by reaction monitoring, chemical & biological transportation safety, and bio-chemical analysis in planetary exploration.

Paper Details

Date Published: 25 February 2010
PDF: 8 pages
Proc. SPIE 7598, Optical Components and Materials VII, 759812 (25 February 2010); doi: 10.1117/12.841146
Show Author Affiliations
Jie Yao, B&W Tek, Inc. (United States)
Irina A. Mokina, B&W Tek, Inc. (United States)
Feng Liu, B&W Tek, Inc. (United States)
Sean Wang, B&W Tek, Inc. (United States)
Jack Zhou, B&W Tek, Inc. (United States)
Michael Lange, Princeton Univ. (United States)
Weiguo Yang, Western Carolina Univ. (United States)
Patrick Gardner, Western Carolina Univ. (United States)
Leora Peltz, The Boeing Co. (United States)
Robert Frampton, The Boeing Co. (United States)
Jeffrey H. Hunt, The Boeing Co. (United States)

Published in SPIE Proceedings Vol. 7598:
Optical Components and Materials VII
Shibin Jiang; Michel J. F. Digonnet; John W. Glesener; J. Christopher Dries, Editor(s)

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