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Proceedings Paper

Electronic polarizability and optical parameters of Er3+/Yb3+ co-doped phosphate glasses
Author(s): Feng Song; Chengguo Ming; Wentao Wang; Lanjun Luo
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Paper Abstract

The samples of Er3+/Yb3+ co-doped phosphate glasses with different Er3+ doped concentrations were prepared by high-temperature melting method. By calculating the electronic polarizabilities and optical basicity of the samples, we find, with the increasing of Er3+ ions concentration, the polarizability and optical basicity of oxide ions become large, which indicates that the covalence of the glasses becomes small. Based on Judd-Ofelt (J-O) theory, the J-O intensity parameters Ωλ (λ=2,4,6), spontaneous radiative lifetime, and fluorescence branching ratio were calculated. With the increasing of Er3+ concentration, the Ω2 values are decrease gradually, which also proves that the covalence of the glasses becomes small. The ratios of Ω46 are within the range of 7.51-9.84, which are larger. Thereby, our glasses are suitable laser materials. We also studied the upconversion (UC) emission of the samples. The strong 657 nm red emission, 546 nm and 523 nm green emissions were observed under 975 nm laser diode (LD) excitation. The UC emission intensities depend on the ratio of Er3+/Yb3+. When the ratio is 0.125, the emissions are strongest. The emission cross sections of UC emissions were analyzed using McCumber theory and Füchtbauer Ladenburg (FL) method. The emission cross section of UC red emission is larger (about 0.5×10-20cm2),which proves our samples are better red light materials.

Paper Details

Date Published: 25 February 2010
PDF: 13 pages
Proc. SPIE 7598, Optical Components and Materials VII, 75981P (25 February 2010); doi: 10.1117/12.841144
Show Author Affiliations
Feng Song, Nankai Univ. (China)
Chengguo Ming, Nankai Univ. (China)
Wentao Wang, Nankai Univ. (China)
Lanjun Luo, Nankai Univ. (China)

Published in SPIE Proceedings Vol. 7598:
Optical Components and Materials VII
Shibin Jiang; Michel J. F. Digonnet; John W. Glesener; J. Christopher Dries, Editor(s)

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