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Proceedings Paper

Confocal microscope with enhanced lateral resolution using engineered illumination pupil
Author(s): B. R. Boruah
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Paper Abstract

The maximum lateral resolution achievable with a confocal microscope is twice that of a wide field microscope. However, the spatial frequency content in the confocal image near the cutoff has very poor signal and is hardly of any practical use. Barring in the fluorescence mode, no technique can provide significant resolution enhancement simultaneously both in the reflection and fluorescence mode of the confocal microscope. This paper describes a technique based on aperture engineering that can significantly enhance the high spatial frequency content in the image of a confocal microscope, in principle, working either in the reflection or the fluorescence mode. Results obtained from numerical simulations and experimental implementation are presented.

Paper Details

Date Published: 24 February 2010
PDF: 6 pages
Proc. SPIE 7570, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII, 75700N (24 February 2010); doi: 10.1117/12.841120
Show Author Affiliations
B. R. Boruah, Indian Institute of Technology Guwahati (India)

Published in SPIE Proceedings Vol. 7570:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

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