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Proceedings Paper

Influence and correction of temperature on optical measurement for fat and protein contents in a complex food model system
Author(s): Xuedian Zhang; Min Chang; Kexin Xu
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Paper Abstract

Near infrared spectroscopy has been proposed as an effective way for measuring complex component compositions noninvasively. However temperature-induced spectral variation can cause accuracy problems if not taken care of in a proper manner. The influence of temperature on optical measurements has been studied for determining fat and protein contents in complex food systems. A model system consisting of mixtures of fat, protein, water and emulsion was developed to create an imitation of complex food systems. The changes in optical properties, including the absorbance coefficients and reduced scattering coefficients, of the system from 25°C to 40°C were measured in the wavelength from 1100 to 1670 nm. Complex changes in the absorbance coefficient and decreasing changes in the reduced scattering coefficients with the increasing temperature were founded. The mechanisms of the influences were analyzed. In order to correct the effect, a statistical method was needed. Then, a method called global robust temperature calibration model is proposed. Accordingly, the validating experiments using the samples made up of 54 complex food systems were executed. The experimental results indicated that the method can significantly reduce the temperature effect on optical measurement.

Paper Details

Date Published: 20 November 2009
PDF: 9 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751127 (20 November 2009); doi: 10.1117/12.841075
Show Author Affiliations
Xuedian Zhang, Univ. of Shanghai for Science and Technology (China)
Min Chang, Univ. of Shanghai for Science and Technology (China)
Kexin Xu, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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